%0 Journal Article %1 journals/tvlsi/HuSH10 %A Hu, Shiyan %A Shah, Patrik %A Hu, Jiang %D 2010 %J IEEE Trans. VLSI Syst. %K dblp %N 6 %P 1002-1006 %T Pattern Sensitive Placement Perturbation for Manufacturability. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi18.html#HuSH10 %V 18

@article{journals/tvlsi/HuSH10, added-at = {2011-02-15T00:00:00.000+0100}, author = {Hu, Shiyan and Shah, Patrik and Hu, Jiang}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2fb3a2d707a0b79d8e95d317c81a899cb/dblp}, ee = {http://dx.doi.org/10.1109/TVLSI.2009.2017268}, interhash = {0d403c99186f82c61f6478d354f1613c}, intrahash = {fb3a2d707a0b79d8e95d317c81a899cb}, journal = {IEEE Trans. VLSI Syst.}, keywords = {dblp}, number = 6, pages = {1002-1006}, timestamp = {2016-02-02T02:13:23.000+0100}, title = {Pattern Sensitive Placement Perturbation for Manufacturability.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi18.html#HuSH10}, volume = 18, year = 2010 }