%0 Journal Article %1 journals/mr/LanzaPNAWH10 %A Lanza, Mario %A Porti, Marc %A Nafría, Montserrat %A Aymerich, Xavier %A Whittaker, E. %A Hamilton, B. %D 2010 %J Microelectronics Reliability %K dblp %N 9-11 %P 1312-1315 %T UHV CAFM characterization of high-k dielectrics: Effect of the technique resolution on the pre- and post-breakdown electrical measurements. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#LanzaPNAWH10 %V 50

@article{journals/mr/LanzaPNAWH10, added-at = {2019-06-02T00:00:00.000+0200}, author = {Lanza, Mario and Porti, Marc and Nafría, Montserrat and Aymerich, Xavier and Whittaker, E. and Hamilton, B.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/204f220ff1c3efa0c6c977cbb653348a2/dblp}, ee = {https://www.wikidata.org/entity/Q60229131}, interhash = {0d0aaa19ec90d906563bf4278b770e83}, intrahash = {04f220ff1c3efa0c6c977cbb653348a2}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1312-1315}, timestamp = {2019-09-27T10:58:15.000+0200}, title = {UHV CAFM characterization of high-k dielectrics: Effect of the technique resolution on the pre- and post-breakdown electrical measurements.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#LanzaPNAWH10}, volume = 50, year = 2010 }