%0 Journal Article %1 kampmann2019builtin %A Kampmann, Matthias %A Kochte, Michael A. %A Liu, Chang %A Schneider, Eric %A Hellebrand, Sybille %A Wunderlich, Hans-Joachim %D 2019 %I IEEE %J IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems %K ubs_10005 ubs_20008 ubs_30085 unibibliografie wos %N 10 %P 1956-1968 %R 10.1109/TCAD.2018.2864255 %T Built-In Test for Hidden Delay Faults %V 38

@article{kampmann2019builtin, added-at = {2020-09-10T16:18:20.000+0200}, affiliation = {Hellebrand, S (Reprint Author), Univ Paderborn, Inst Elect Engn & Informat Technol, D-33098 Paderborn, Germany. Kampmann, Matthias; Hellebrand, Sybille, Univ Paderborn, Inst Elect Engn & Informat Technol, D-33098 Paderborn, Germany. Kochte, Michael A.; Liu, Chang; Schneider, Eric; Wunderlich, Hans-Joachim, Univ Stuttgart, Inst Comp Architecture & Comp Engn, D-70569 Stuttgart, Germany.}, author = {Kampmann, Matthias and Kochte, Michael A. and Liu, Chang and Schneider, Eric and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/22aa11c93c2826fce1c5ee1d66ff4a77c/unibiblio}, doi = {10.1109/TCAD.2018.2864255}, interhash = {0bad4b1d3c8e60f59764a014348921fa}, intrahash = {2aa11c93c2826fce1c5ee1d66ff4a77c}, issn = {{0278-0070} and {1937-4151}}, journal = {IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems}, keywords = {ubs_10005 ubs_20008 ubs_30085 unibibliografie wos}, language = {eng}, number = 10, orcid-numbers = {Wunderlich, Hans-Joachim/0000-0003-4536-8290 Hellebrand, Sybille/0000-0002-3717-3939}, pages = {1956-1968}, publisher = {IEEE}, research-areas = {Computer Science; Engineering}, timestamp = {2020-09-10T14:18:20.000+0200}, title = {Built-In Test for Hidden Delay Faults}, unique-id = {ISI:000487193400014}, volume = 38, year = 2019 }