%0 Conference Paper %1 conf/dft/GhaidaZ07 %A Ghaida, Rani S. %A Zarkesh-Ha, Payman %B DFT %D 2007 %E Bolchini, Cristiana %E Kim, Yong-Bin %E Salsano, Adelio %E Touba, Nur A. %I IEEE Computer Society %K dblp %P 59-67 %T Estimation of Electromigration-Aggravating Narrow Interconnects Using a Layout Sensitivity Model. %U http://dblp.uni-trier.de/db/conf/dft/dft2007.html#GhaidaZ07 %@ 0-7695-2885-6

@inproceedings{conf/dft/GhaidaZ07, added-at = {2014-11-10T00:00:00.000+0100}, author = {Ghaida, Rani S. and Zarkesh-Ha, Payman}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/25195760abe768b6caa4e35343707f09f/dblp}, booktitle = {DFT}, crossref = {conf/dft/2007}, editor = {Bolchini, Cristiana and Kim, Yong-Bin and Salsano, Adelio and Touba, Nur A.}, ee = {http://doi.ieeecomputersociety.org/10.1109/DFT.2007.12}, interhash = {09f43b21202d8a783fa74e5961ae8348}, intrahash = {5195760abe768b6caa4e35343707f09f}, isbn = {0-7695-2885-6}, keywords = {dblp}, pages = {59-67}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T12:14:01.000+0100}, title = {Estimation of Electromigration-Aggravating Narrow Interconnects Using a Layout Sensitivity Model.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft2007.html#GhaidaZ07}, year = 2007 }