%0 Journal Article %1 journals/tcad/NassifSD86 %A Nassif, Sani R. %A Strojwas, Andrzej J. %A Director, Stephen W. %D 1986 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 1 %P 104-113 %T A Methodology for Worst-Case Analysis of Integrated Circuits. %U http://dblp.uni-trier.de/db/journals/tcad/tcad5.html#NassifSD86 %V 5

@article{journals/tcad/NassifSD86, added-at = {2011-10-26T00:00:00.000+0200}, author = {Nassif, Sani R. and Strojwas, Andrzej J. and Director, Stephen W.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e7201374e265f356ca0119b02cce7b58/dblp}, ee = {http://dx.doi.org/10.1109/TCAD.1986.1270181}, interhash = {0652b11004ffb27b75e7c01d2d7a4062}, intrahash = {e7201374e265f356ca0119b02cce7b58}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 1, pages = {104-113}, timestamp = {2016-02-02T10:07:48.000+0100}, title = {A Methodology for Worst-Case Analysis of Integrated Circuits.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad5.html#NassifSD86}, volume = 5, year = 1986 }