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%0 Conference Paper
%1 conf/ets/OhlerH05
%A Öhler, Philipp
%A Hellebrand, Sybille
%B European Test Symposium
%D 2005
%I IEEE Computer Society
%K dblp
%P 148-153
%T Low power embedded DRAMs with high quality error correcting capabilities.
%U http://dblp.uni-trier.de/db/conf/ets/ets2005.html#OhlerH05
%@ 0-7695-2341-2
@inproceedings{conf/ets/OhlerH05,
added-at = {2015-08-18T00:00:00.000+0200},
author = {Öhler, Philipp and Hellebrand, Sybille},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2f3367c7b995107a04e4736e4f0e41aeb/dblp},
booktitle = {European Test Symposium},
crossref = {conf/ets/2005},
ee = {http://doi.ieeecomputersociety.org/10.1109/ETS.2005.28},
interhash = {01a0c377679b3491534617bccaa61fc5},
intrahash = {f3367c7b995107a04e4736e4f0e41aeb},
isbn = {0-7695-2341-2},
keywords = {dblp},
pages = {148-153},
publisher = {IEEE Computer Society},
timestamp = {2016-02-02T15:20:08.000+0100},
title = {Low power embedded DRAMs with high quality error correcting capabilities.},
url = {http://dblp.uni-trier.de/db/conf/ets/ets2005.html#OhlerH05},
year = 2005
}
