%0 Journal Article %1 journals/mr/AtanassovaP07 %A Atanassova, Elena %A Paskaleva, Albena %D 2007 %J Microelectronics Reliability %K dblp %N 6 %P 913-923 %T Challenges of Ta2O5 as high-k dielectric for nanoscale DRAMs. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#AtanassovaP07 %V 47

@article{journals/mr/AtanassovaP07, added-at = {2015-02-06T00:00:00.000+0100}, author = {Atanassova, Elena and Paskaleva, Albena}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2ca9aea6d8c9a1253b4afebbf6417696c/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2006.06.006}, interhash = {012631fd6c8af9fbb733a98e6bf0d663}, intrahash = {ca9aea6d8c9a1253b4afebbf6417696c}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 6, pages = {913-923}, timestamp = {2016-02-02T02:00:38.000+0100}, title = {Challenges of Ta2O5 as high-k dielectric for nanoscale DRAMs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#AtanassovaP07}, volume = 47, year = 2007 }