Thermoelectric materials exhibit correlated transport of charge and heat. The Johnson-Nyquist noise formula 4k B T R for the spectral density of voltage fluctuations accounts for fluctuations associated solely with Ohmic dissipation. Applying the fluctuation-dissipation theorem, we generalize the Johnson-Nyquist formula for thermoelectrics, finding an enhanced voltage fluctuation spectral density 4k B T R(1 + Z D T) at frequencies below a thermal cut-off frequency f T, where Z D T is the dimensionless thermoelectric device figure of merit. The origin of the enhancement in voltage noise is thermoelectric coupling of temperature fluctuations. We use a wideband , integrated thermoelectric micro-device to experimentally confirm our findings. Measuring the Z D T enhanced voltage noise, we experimentally resolve temperature fluctuations with a root mean square amplitude of at a mean temperature of 295 K. We find that thermoelectric devices can be used for thermometry with sufficient resolution to measure the fundamental temperature fluctuations described by the fluctuation-dissipation theorem.
%0 Journal Article
%1 ubo_mods_00206902
%A Tran, N.A.M.
%A Dutt, A.S.
%A Pulumati, N.B.
%A Reith, H.
%A Hu, A.
%A Dumont, A.
%A Nielsch, K.
%A Tremblay, A.-M.S.
%A Schierning, Gabi
%A Reulet, B.
%A Szkopek, T.
%A Tremblay, A.-M. S.
%C Les-Ulis
%D 2023
%I Institute of Physics Publishing
%J EPL (Europhysics Letters)
%K bibliothekswesen imported test5
%N 2
%R 10.1209/0295-5075/acb009
%T Fluctuation-dissipation in thermoelectric sensors
%U https://iopscience.iop.org/article/10.1209/0295-5075/acb009/pdf
%V 141
%X Thermoelectric materials exhibit correlated transport of charge and heat. The Johnson-Nyquist noise formula 4k B T R for the spectral density of voltage fluctuations accounts for fluctuations associated solely with Ohmic dissipation. Applying the fluctuation-dissipation theorem, we generalize the Johnson-Nyquist formula for thermoelectrics, finding an enhanced voltage fluctuation spectral density 4k B T R(1 + Z D T) at frequencies below a thermal cut-off frequency f T, where Z D T is the dimensionless thermoelectric device figure of merit. The origin of the enhancement in voltage noise is thermoelectric coupling of temperature fluctuations. We use a wideband , integrated thermoelectric micro-device to experimentally confirm our findings. Measuring the Z D T enhanced voltage noise, we experimentally resolve temperature fluctuations with a root mean square amplitude of at a mean temperature of 295 K. We find that thermoelectric devices can be used for thermometry with sufficient resolution to measure the fundamental temperature fluctuations described by the fluctuation-dissipation theorem.
@article{ubo_mods_00206902,
abstract = {Thermoelectric materials exhibit correlated transport of charge and heat. The Johnson-Nyquist noise formula 4k B T R for the spectral density of voltage fluctuations accounts for fluctuations associated solely with Ohmic dissipation. Applying the fluctuation-dissipation theorem, we generalize the Johnson-Nyquist formula for thermoelectrics, finding an enhanced voltage fluctuation spectral density 4k B T R(1 + Z D T) at frequencies below a thermal cut-off frequency f T, where Z D T is the dimensionless thermoelectric device figure of merit. The origin of the enhancement in voltage noise is thermoelectric coupling of temperature fluctuations. We use a wideband , integrated thermoelectric micro-device to experimentally confirm our findings. Measuring the Z D T enhanced voltage noise, we experimentally resolve temperature fluctuations with a root mean square amplitude of at a mean temperature of 295 K. We find that thermoelectric devices can be used for thermometry with sufficient resolution to measure the fundamental temperature fluctuations described by the fluctuation-dissipation theorem.},
added-at = {2023-09-05T08:34:31.000+0200},
address = {Les-Ulis},
author = {Tran, N.A.M. and Dutt, A.S. and Pulumati, N.B. and Reith, H. and Hu, A. and Dumont, A. and Nielsch, K. and Tremblay, A.-M.S. and Schierning, Gabi and Reulet, B. and Szkopek, T. and Tremblay, A.-M. S.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/26549bc3d985206347f34c0ffc8c6ec32/roberta.toscano},
doi = {10.1209/0295-5075/acb009},
interhash = {208f8140da67ebdf614f70b154d02d85},
intrahash = {6549bc3d985206347f34c0ffc8c6ec32},
issn = {1286-4854},
journal = {EPL (Europhysics Letters)},
keywords = {bibliothekswesen imported test5},
language = {en},
number = 2,
publisher = {Institute of Physics Publishing},
timestamp = {2023-09-13T14:11:46.000+0200},
title = {Fluctuation-dissipation in thermoelectric sensors},
url = {https://iopscience.iop.org/article/10.1209/0295-5075/acb009/pdf},
volume = 141,
year = 2023
}