%0 Journal Article %1 ubo_mods_00206902 %A Tran, N.A.M. %A Dutt, A.S. %A Pulumati, N.B. %A Reith, H. %A Hu, A. %A Dumont, A. %A Nielsch, K. %A Tremblay, A.-M.S. %A Schierning, Gabi %A Reulet, B. %A Szkopek, T. %A Tremblay, A.-M. S. %C Les-Ulis %D 2023 %I Institute of Physics Publishing %J EPL (Europhysics Letters) %K bibliothekswesen imported test5 %N 2 %R 10.1209/0295-5075/acb009 %T Fluctuation-dissipation in thermoelectric sensors %U https://iopscience.iop.org/article/10.1209/0295-5075/acb009/pdf %V 141 %X Thermoelectric materials exhibit correlated transport of charge and heat. The Johnson-Nyquist noise formula 4k B T R for the spectral density of voltage fluctuations accounts for fluctuations associated solely with Ohmic dissipation. Applying the fluctuation-dissipation theorem, we generalize the Johnson-Nyquist formula for thermoelectrics, finding an enhanced voltage fluctuation spectral density 4k B T R(1 + Z D T) at frequencies below a thermal cut-off frequency f T, where Z D T is the dimensionless thermoelectric device figure of merit. The origin of the enhancement in voltage noise is thermoelectric coupling of temperature fluctuations. We use a wideband , integrated thermoelectric micro-device to experimentally confirm our findings. Measuring the Z D T enhanced voltage noise, we experimentally resolve temperature fluctuations with a root mean square amplitude of at a mean temperature of 295 K. We find that thermoelectric devices can be used for thermometry with sufficient resolution to measure the fundamental temperature fluctuations described by the fluctuation-dissipation theorem.

@article{ubo_mods_00206902, abstract = {Thermoelectric materials exhibit correlated transport of charge and heat. The Johnson-Nyquist noise formula 4k B T R for the spectral density of voltage fluctuations accounts for fluctuations associated solely with Ohmic dissipation. Applying the fluctuation-dissipation theorem, we generalize the Johnson-Nyquist formula for thermoelectrics, finding an enhanced voltage fluctuation spectral density 4k B T R(1 + Z D T) at frequencies below a thermal cut-off frequency f T, where Z D T is the dimensionless thermoelectric device figure of merit. The origin of the enhancement in voltage noise is thermoelectric coupling of temperature fluctuations. We use a wideband , integrated thermoelectric micro-device to experimentally confirm our findings. Measuring the Z D T enhanced voltage noise, we experimentally resolve temperature fluctuations with a root mean square amplitude of at a mean temperature of 295 K. We find that thermoelectric devices can be used for thermometry with sufficient resolution to measure the fundamental temperature fluctuations described by the fluctuation-dissipation theorem.}, added-at = {2023-09-05T08:34:31.000+0200}, address = {Les-Ulis}, author = {Tran, N.A.M. and Dutt, A.S. and Pulumati, N.B. and Reith, H. and Hu, A. and Dumont, A. and Nielsch, K. and Tremblay, A.-M.S. and Schierning, Gabi and Reulet, B. and Szkopek, T. and Tremblay, A.-M. S.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/26549bc3d985206347f34c0ffc8c6ec32/roberta.toscano}, doi = {10.1209/0295-5075/acb009}, interhash = {208f8140da67ebdf614f70b154d02d85}, intrahash = {6549bc3d985206347f34c0ffc8c6ec32}, issn = {1286-4854}, journal = {EPL (Europhysics Letters)}, keywords = {bibliothekswesen imported test5}, language = {en}, number = 2, publisher = {Institute of Physics Publishing}, timestamp = {2023-09-13T14:11:46.000+0200}, title = {Fluctuation-dissipation in thermoelectric sensors}, url = {https://iopscience.iop.org/article/10.1209/0295-5075/acb009/pdf}, volume = 141, year = 2023 }