Publications

Jens Anders, Pablo Andreu, Bernd Becker, Steffen Becker, Riccardo Cantoro, Nikolaos I. Deligiannis, Nourhan Elhamawy, Tobias Faller, Carles Hernandez, Nele Mentens, Mahnaz Namazi Rizi, Ilia Polian, Abolfazl Sajadi, Mathias Sauer, Denis Schwachhofer, Matteo Sonza Reorda, Todor Stefanov, Ilya Tuzov, Stefan Wagner, and Nuša Zidarič. A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors. 2023 IEEE European Test Symposium (ETS), IEEE, 2023. [PUMA: mult ubs_10005 ubs_20007 ubs_20008 ubs_30085 ubs_30182 ubs_30204 ubs_40122 ubs_40123 ubs_40304 ubs_40307 unibibliografie wos]

Denis Schwachhofer, Maik Betka, Steffen Becker, Stefan Wagner, Matthias Sauer, and Ilia Polian. Automating Greybox System-Level Test Generation. 2023 IEEE European Test Symposium (ETS), IEEE, 2023. [PUMA: mult ubs_10005 ubs_20008 ubs_30085 ubs_30204 ubs_40122 ubs_40123 ubs_40304 unibibliografie wos]

Jaume Abella, Sergi Alcaide, Jens Anders, Francisco Bas, Steffen Becker, Elke De Mulder, Nourhan Elhamawy, Frank K. Gürkaynak, Helena Handschuh, Carles Hernandez, Mike Hutter, Leonidas Kosmidis, Ilia Polian, Matthias Sauer, Stefan Wagner, and Francesco Regazzoni. Security, Reliability and Test Aspects of the RISC-V Ecosystem. In Mottaqiallah Taouil (Eds.), 2021 IEEE European Test Symposium (ETS), 1-10, IEEE, Piscataway, 2021. [PUMA: mult ubs_10005 ubs_20007 ubs_20008 ubs_30085 ubs_30182 ubs_30204 ubs_40122 ubs_40123 ubs_40304 ubs_40307 unibibliografie wos]

Ilia Polian, Jens Anders, Steffen Becker, Paolo Bernardi, Krishnendu Chakrabarty, Nourhan Elhamawy, Matthias Sauer, Adit Singh, Matteo Sonza Reorda, and Stefan Wagner. Exploring the Mysteries of System-Level Test. 2020 IEEE 29th Asian Test Symposium (ATS), 1-6, IEEE, 2020. [PUMA: mult ubs_10005 ubs_20007 ubs_20008 ubs_30085 ubs_30182 ubs_30204 ubs_40122 ubs_40123 ubs_40304 ubs_40307 unibibliografie wos]