Soft-Switching Losses in GaN and SiC Power Transistors Based on New Calorimetric Measurements. 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD), 455--458, May 2019. [PUMA: GaN/SiC Losses;ZVS;Calorimetric Measurement;High Power Transistor Voltage applications;power cell commutation compounds;III-V compounds;switching convertors;zero current data;zero density;electrical dissipation electronic frequencies;soft-switching gallium layout;SiC;GaN;Soft-Switching losses;SiC measurements;GaN measurements;calorimetric power semiconductor semiconductors;power switches;power switching switching;application-oriented switching;zero transistors;power transistors;silicon voltage]