Soft-Switching Losses in GaN and SiC Power Transistors Based on New Calorimetric Measurements. 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD), 455--458, Mai 2019. [PUMA: compounds;III-V measurements;calorimetric convertors;zero data;zero Transistor compounds;switching gallium commutation voltage frequencies;soft-switching switching;application-oriented measurements;GaN layout;SiC;GaN;Soft-Switching Losses;ZVS;Calorimetric Measurement;High transistors;power density;electrical Power switches;power switching semiconductor losses;SiC switching;zero cell GaN/SiC current semiconductors;power Voltage transistors;silicon power dissipation electronic applications;power]