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A reliable 40 GHz opto-electrical system for characterization of frequency response of Ge PIN photo detectors

W. Zhang, K. Ye, S. Bechler, K. Ulbricht, M. Oehme, E. Kasper, and J. Schulze. 2014 7th International Silicon-Germanium Technology and Device Meeting (ISTDM), page 117-118. Piscataway, NJ, IEEE, (2014)
DOI: 10.1109/ISTDM.2014.6874649

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K. Stahl

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Dipl.-Ing. Thomas Kuestner

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Other publications of authors with the same name

A reliable 40 GHz opto-electrical system for characterization of frequency response of Ge PIN photo detectorsW. Zhang, K. Ye, S. Bechler, K. Ulbricht, M. Oehme, E. Kasper, and J. Schulze. 2014 7th International Silicon-Germanium Technology and Device Meeting (ISTDM), page 117-118. Piscataway, NJ, IEEE, (2014)Franz-Keldysh effect of Ge-on-Si pin diodes at common chip temperaturesM. Schmid, M. Kaschel, M. Gollhofer, M. Oehme, J. Werner, K. Ulbricht, E. Kasper, and J. Schulze. Integrated Photonics : Materials, Devices, and Applications II, 8767, page 87670C. SPIE, (2013)