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A Mixed-Mode BIST Scheme Based on Folding Compression., , and . J. Comput. Sci. Technol., 17 (2): 203-212 (2002)Deterministic logic BIST for transition fault testing., , , and . IET Computers & Digital Techniques, 1 (3): 180-186 (2007)A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction., , , , , and . DFT, page 50-58. IEEE Computer Society, (2007)Adaptive Bayesian Diagnosis of Intermittent Faults., , , , and . J. Electronic Testing, 30 (5): 527-540 (2014)Deterministic BIST with Partial Scan., and . J. Electronic Testing, 16 (3): 169-177 (2000)An analytical approach to the partial scan problem., and . J. Electronic Testing, 1 (2): 163-174 (1990)SAT-based ATPG beyond stuck-at fault testing., and . it - Information Technology, 56 (4): 165-172 (2014)DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme (DFG-Project - Test and Reliability of Nano-Electronic Systems)., , , , and . it - Information Technology, 48 (5): 304- (2006)Using mission logic for embedded testing., and . DATE, page 805. IEEE Computer Society, (2001)Deterministic Pattern Generation for Weighted Random Pattern Testing., and . ED&TC, page 30-36. IEEE Computer Society, (1996)