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Determination of Hard- and Soft-Switching Losses for Wide Bandgap Power Transistors with Noninvasive and Fast Calorimetric Measurements

J. Weimer, D. Koch, R. Schnitzler, and I. Kallfass. 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD), page 327-330. Piscataway, IEEE, (2021)
DOI: 10.23919/ISPSD50666.2021.9452230

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Julian Schöpf University of Stuttgart

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