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Al Structures Using Kelvin Probe Force Microscopy and Constant Voltage Stress

S. Choudhary, D. Schwarz, H. Funk, R. Khosla, S. Sharma, and J. Schulze. IEEE transactions on nanotechnology, (2021)
DOI: 10.1109/TNANO.2021.3069820

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Robin Göbel University of Stuttgart

Univ. -Prof. Dr. Robin Ghosh University of Stuttgart

Prof. Dr. Robin Hahn University of Stuttgart

Robin Wickersheim University of Stuttgart

Robin Gerl University of Stuttgart

Other publications of authors with the same name

Metal (Pt)/ferroelectric (SrBi2Ta2O9)/insulator (La2O3)/semiconductor (Si), MFIS structures for nonvolatile memory applicationsS. Rathaur, R. Khosla, and S. Sharma. Applied physics letters, 119 (6): 063505 (2021)Impact of Charge Trapping On Epitaxial p-Ge-on-p-Si and HfO2 Based Al/HfO2/p-Ge-on-p-Si/Al Structures Using Kelvin Probe Force Microscopy and Constant Voltage StressS. Choudhary, D. Schwarz, H. Funk, R. Khosla, S. Sharma, and J. Schulze. IEEE Transactions on Nanotechnology, (2021)High-quality remote plasma enhanced atomic layer deposition of aluminum oxide thin films for nanoelectronics applicationsR. Khosla, D. Schwarz, H. Funk, K. Guguieva, and J. Schulze. Solid state electronics, 185 (November): 108027 (2021)Impact of Charge Trapping On Epitaxial p-Ge-on-p-Si and HfO2 Based Al/HfO2/p-Ge-on-p-Si/Al Structures Using Kelvin Probe Force Microscopy and Constant Voltage StressS. Choudhary, D. Schwarz, H. Funk, R. Khosla, S. Sharma, and J. Schulze. IEEE transactions on nanotechnology, (2021)Integration of Ferroelectric Materials : An Ultimate Solution for Next-Generation Computing and Storage DevicesR. Khosla, and S. Sharma. ACS applied electronic materials, 3 (7): 2862-2897 (2021)A Steep Slope MBE-Grown Thin p-Ge Channel FETs on Bulk Ge-on-Si Using HZO Internal Voltage AmplificationS. Choudhary, D. Schwarz, H. Funk, D. Weißhaupt, R. Khosla, S. Sharma, and J. Schulze. IEEE transactions on electron devices, 69 (5): 2725-2731 (2022)Charge Trapping Analysis of Metal/Al2O3/SiO2/Si, Gate Stack for Emerging Embedded MemoriesR. Khosla, E. Rolseth, P. Kumar, S. Vadakupudhupalayam, S. Sharma, and J. Schulze. IEEE transactions on device and materials reliability, 17 (1): 80-89 (2017)Maskless lithography : an approach to SU-8 based sensitive and high-g Z-axis polymer MEMS accelerometerM. Jangra, D. Arya, R. Khosla, and S. Sharma. Microsystem technologies, 27 (8): 2925-2934 (2021)

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Disambiguation of "Khosla, Robin"