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Toward Security Closure in the Face of Reliability Effects ICCAD Special Session Paper

J. Lienig, S. Rothe, M. Thiele, N. Rangarajan, M. Ashraf, M. Nabeel, H. Amrouch, O. Sinanoglu, and J. Knechtel. 2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), Piscataway, IEEE, (2021)
DOI: 10.1109/ICCAD51958.2021.9643447

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Osama Mohammed University of Stuttgart

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Rethinking Split Manufacturing: An Information-Theoretic Approach with Secure Layout Techniques.A. Sengupta, S. Patnaik, J. Knechtel, M. Ashraf, S. Garg, and O. Sinanoglu. CoRR, (2017)Obfuscating the Interconnects: Low-Cost and Resilient Full-Chip Layout Camouflaging.S. Patnaik, M. Ashraf, J. Knechtel, and O. Sinanoglu. CoRR, (2017)Concerted Wire Lifting: Enabling Secure and Cost-Effective Split Manufacturing.S. Patnaik, J. Knechtel, M. Ashraf, and O. Sinanoglu. CoRR, (2018)Best of both worlds: integration of split manufacturing and camouflaging into a security-driven CAD flow for 3D ICs.S. Patnaik, M. Ashraf, O. Sinanoglu, and J. Knechtel. ICCAD, page 8. ACM, (2018)Security Closure of Physical Layouts ICCAD Special Session PaperJ. Knechtel, J. Gopinath, J. Bhandari, M. Ashraf, H. Amrouch, S. Borkar, S. Lim, O. Sinanoglu, and R. Karri. 2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), Piscataway, IEEE, (2021)A Modern Approach to IP Protection and Trojan Prevention: Split Manufacturing for 3D ICs and Obfuscation of Vertical Interconnects.S. Patnaik, M. Ashraf, O. Sinanoglu, and J. Knechtel. CoRR, (2019)A differential evolution-based approach to design all-terrain ground vehicle wheels.A. Khamis, and M. Ashraf. ICARSC, page 310-315. IEEE, (2017)Concerted Wire Lifting: Enabling Secure and Cost-Effective Split Manufacturing.S. Patnaik, M. Ashraf, H. Li, J. Knechtel, and O. Sinanoglu. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (2): 266-280 (2022)Toward Security Closure in the Face of Reliability Effects ICCAD Special Session PaperJ. Lienig, S. Rothe, M. Thiele, N. Rangarajan, M. Ashraf, M. Nabeel, H. Amrouch, O. Sinanoglu, and J. Knechtel. 2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), Piscataway, IEEE, (2021)Design-time exploration of voltage switching against power analysis attacks in 14 nm FinFET technologyJ. Knechtel, T. Asha, N. Fernengel, S. Patnaik, M. Nabeel, M. Ashraf, O. Sinanoglu, and H. Amrouch. Integration, 85 (July): 27-34 (2022)

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Toward Security Closure in the Face of Reliability Effects ICCAD Special Session Paper

Please choose a person to relate this publication to

Osama Mohammed University of Stuttgart

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copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Toward Security Closure in the Face of Reliability Effects ICCAD Special Session Paper

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Osama Mohammed University of Stuttgart

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Toward Security Closure in the Face of Reliability Effects ICCAD Special Session Paper