{ "types" : { "Bookmark" : { "pluralLabel" : "Bookmarks" }, "Publication" : { "pluralLabel" : "Publications" }, "GoldStandardPublication" : { "pluralLabel" : "GoldStandardPublications" }, "GoldStandardBookmark" : { "pluralLabel" : "GoldStandardBookmarks" }, "Tag" : { "pluralLabel" : "Tags" }, "User" : { "pluralLabel" : "Users" }, "Group" : { "pluralLabel" : "Groups" }, "Sphere" : { "pluralLabel" : "Spheres" } }, "properties" : { "count" : { "valueType" : "number" }, "date" : { "valueType" : "date" }, "changeDate" : { "valueType" : "date" }, "url" : { "valueType" : "url" }, "id" : { "valueType" : "url" }, "tags" : { "valueType" : "item" }, "user" : { "valueType" : "item" } }, "items" : [ { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/2786180a4330f581329b650c3dd2f4cd5/brasche", "tags" : [ "Metastable_phases","Neutron_diffraction","Transition_states","X-ray_diffraction","diffraction","myown" ], "intraHash" : "786180a4330f581329b650c3dd2f4cd5", "interHash" : "9790fe654a30da8186050580ab13ce9f", "label" : "In situ diffraction in electrochemistry \u2013 A practical introduction for experiments beyond batteries", "user" : "brasche", "description" : "", "date" : "2024-03-25 12:35:57", "changeDate" : "2024-03-25 12:38:49", "count" : 2, "pub-type": "article", "journal": "Current Opinion in Electrochemistry", "year": "2023", "url": "https://www.sciencedirect.com/science/article/pii/S2451910323000819", "author": [ "Iuliia Neumann","Bertold Rasche" ], "authors": [ {"first" : "Iuliia", "last" : "Neumann"}, {"first" : "Bertold", "last" : "Rasche"} ], "volume": "39","pages": "101288","abstract": "Electrochemistry and diffraction complement each other particularly well when it comes to the investigation of solids and their surfaces. The electrochemical experiment provides access to thermodynamic and kinetic information, while diffraction provides insights into the atomic structure of crystalline but also amorphous compounds. Gaining these information in one experiment in situ means to trigger phase transitions at ambient temperatures, track rapid changes, and avoid environmental instabilities. Consequently, otherwise non-accessible metastable and transitional phases and structures can be discovered. However, this method is not only limited to bulk phases but also provides information on electrode surfaces. Understanding and building batteries have been one of the main driving forces to establish this technique; nevertheless, this short review intends to provide a \u201Csurvival guide\u201D how to apply the powerful in situ diffraction of electrochemical experiments beyond battery materials. Therefore, we briefly discuss the method together with the available setups and present selected recent examples.", "language" : "en", "file" : "Neumann und Rasche - 2023 - In situ diffraction in electrochemistry \u2013 A practi.pdf:files/6158/Neumann und Rasche - 2023 - In situ diffraction in electrochemistry \u2013 A practi.pdf:application/pdf;ScienceDirect Snapshot:files/6159/S2451910323000819.html:text/html", "issn" : "2451-9103", "doi" : "10.1016/j.coelec.2023.101288", "urldate" : "2023-06-07", "bibtexKey": "neumann_situ_2023" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/2395434d1f3dd410a8c01682fbe0e257c/florianbienert", "tags" : [ "Diode","Laser","Lithography","Volume","Waveguide","diffraction","gratings","infrared","lasers","myown","operation","peer" ], "intraHash" : "395434d1f3dd410a8c01682fbe0e257c", "interHash" : "265a3944d166013fa6cf5dc2700ad689", "label" : "Diode stabilization with dual duty-cycle resonant waveguide grating", "user" : "florianbienert", "description" : "", "date" : "2023-12-08 14:52:53", "changeDate" : "2023-12-08 14:52:53", "count" : 4, "pub-type": "conference", "journal": "Laser Congress 2023 (ASSL, LAC)","booktitle": "Laser Congress 2023 (ASSL, LAC)","publisher":"Optica Publishing Group", "year": "2023", "url": "https://opg.optica.org/abstract.cfm?URI=ASSL-2023-AW3A.5", "author": [ "Florian Bienert","Fangfang Li","Marina Fetisova","Petri Karvinen","Markku Kuittinen","Thomas Graf","Marwan Abdou Ahmed" ], "authors": [ {"first" : "Florian", "last" : "Bienert"}, {"first" : "Fangfang", "last" : "Li"}, {"first" : "Marina", "last" : "Fetisova"}, {"first" : "Petri", "last" : "Karvinen"}, {"first" : "Markku", "last" : "Kuittinen"}, {"first" : "Thomas", "last" : "Graf"}, {"first" : "Marwan", "last" : "Abdou Ahmed"} ], "pages": "AW3A.5","abstract": "We present for the first time the experimental demonstration of resonant waveguide grating (RWG) employing a dual duty-cycle profile for the stabilization of a 50 W laser diode emitting in the near-infrared spectral range.", "bibtexKey": "Bienert:23" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/2351d23d83d82758f9f2b4a880651d5ac/ifsw", "tags" : [ "myown","chirp","diffraction","peer","interference","diffraction_grating","from:florianbienert" ], "intraHash" : "351d23d83d82758f9f2b4a880651d5ac", "interHash" : "7b7d90ef08e1e7c7c007e0771e7ba3b2", "label" : "Simple spatially resolved period measurement of chirped pulse compression gratings", "user" : "ifsw", "description" : "", "date" : "2023-06-03 15:24:54", "changeDate" : "2023-06-03 15:25:40", "count" : 1, "pub-type": "article", "journal": "Opt. Express","publisher":"Optica Publishing Group", "year": "2023", "url": "https://opg.optica.org/oe/abstract.cfm?URI=oe-31-12-19392", "author": [ "Florian Bienert","Christoph Röcker","Thomas Graf","Marwan Abdou Ahmed" ], "authors": [ {"first" : "Florian", "last" : "Bienert"}, {"first" : "Christoph", "last" : "Röcker"}, {"first" : "Thomas", "last" : "Graf"}, {"first" : "Marwan Abdou", "last" : "Ahmed"} ], "volume": "31","number": "12","pages": "19392--19403","abstract": "We present an easy-to-implement and low-cost setup for the precise measurement of the period chirp of diffraction gratings offering a resolution of 15 pm and reasonable scan speeds of 2 seconds per measurement point. The principle of the measurement is illustrated on the example of two different pulse compression gratings, one fabricated by laser interference lithography (LIL) and the other by scanning beam interference lithography (SBIL). A period chirp of 0.22 pm/mm2 at a nominal period of 610 nm was measured for the grating fabricated with LIL, whereas no chirp was observed for the grating fabricated by SBIL, which had a nominal period of 586.2 nm.", "doi" : "10.1364/OE.489238", "bibtexKey": "Bienert:23" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/2a8492260592f80e99852d85b3cde1c6f/florianbienert", "tags" : [ "chirp","diffraction","diffraction_grating","interference","myown","peer" ], "intraHash" : "a8492260592f80e99852d85b3cde1c6f", "interHash" : "9a3e04001920d37b1994c5ed9ba327b8", "label" : "General mathematical model for the period chirp in interference lithography", "user" : "florianbienert", "description" : "", "date" : "2023-02-13 10:25:03", "changeDate" : "2023-02-13 09:30:32", "count" : 3, "pub-type": "article", "journal": "Opt. Express","publisher":"Optica Publishing Group", "year": "2023", "url": "https://opg.optica.org/oe/abstract.cfm?URI=oe-31-4-5334", "author": [ "Florian Bienert","Thomas Graf","Marwan Abdou Ahmed" ], "authors": [ {"first" : "Florian", "last" : "Bienert"}, {"first" : "Thomas", "last" : "Graf"}, {"first" : "Marwan Abdou", "last" : "Ahmed"} ], "volume": "31","number": "4","pages": "5334--5346","abstract": "We present a general analytical model for the calculation of the spatial distribution of the grating period, enabling the unification of all configurations of classical laser interference lithography (LIL) and scanning-beam interference lithography (SBIL) into one formalism. This is possible due to the consideration of Gaussian beams instead of point sources which allow for the accurate description of not only the laser&\\#x2019;s far-field but also its near-field. The proposed model enables the calculation of the grating period, the inclination and the slant of the grating lines on arbitrarily shaped substrates, originating from the interference of arbitrarily orientated and positioned Gaussian beams.", "doi" : "10.1364/OE.481887", "bibtexKey": "Bienert:23" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/2a8492260592f80e99852d85b3cde1c6f/ifsw", "tags" : [ "myown","chirp","period","Interference","diffraction","Laser-Interference-Lithography","diffraction_grating","shaping","from:florianbienert","mathematical","Beam","peer","Laser","beams","gratings","interference","model","Gaussian","Holographic","Scanning-Beam-Interference-Lithography" ], "intraHash" : "a8492260592f80e99852d85b3cde1c6f", "interHash" : "9a3e04001920d37b1994c5ed9ba327b8", "label" : "General mathematical model for the period chirp in interference lithography", "user" : "ifsw", "description" : "", "date" : "2023-02-13 10:24:21", "changeDate" : "2023-02-13 09:30:48", "count" : 3, "pub-type": "article", "journal": "Opt. Express","publisher":"Optica Publishing Group", "year": "2023", "url": "https://opg.optica.org/oe/abstract.cfm?URI=oe-31-4-5334", "author": [ "Florian Bienert","Thomas Graf","Marwan Abdou Ahmed" ], "authors": [ {"first" : "Florian", "last" : "Bienert"}, {"first" : "Thomas", "last" : "Graf"}, {"first" : "Marwan Abdou", "last" : "Ahmed"} ], "volume": "31","number": "4","pages": "5334--5346","abstract": "We present a general analytical model for the calculation of the spatial distribution of the grating period, enabling the unification of all configurations of classical laser interference lithography (LIL) and scanning-beam interference lithography (SBIL) into one formalism. This is possible due to the consideration of Gaussian beams instead of point sources which allow for the accurate description of not only the laser&\\#x2019;s far-field but also its near-field. The proposed model enables the calculation of the grating period, the inclination and the slant of the grating lines on arbitrarily shaped substrates, originating from the interference of arbitrarily orientated and positioned Gaussian beams.", "doi" : "10.1364/OE.481887", "bibtexKey": "Bienert:23" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/21105676d6caa214a31e39d6d56969daa/ifsw", "tags" : [ "myown","grating","diffraction","laser","peer","from:a.boubekraoui","Thin-disk" ], "intraHash" : "1105676d6caa214a31e39d6d56969daa", "interHash" : "83e4235580a2d04c84dace8c96f28f1f", "label" : "Intra-cavity wavelength multiplexing of high-brightness thin-disk laser beams", "user" : "ifsw", "description" : "", "date" : "2022-07-12 10:26:37", "changeDate" : "2022-07-12 08:26:37", "count" : 2, "pub-type": "article", "journal": "Applied Physics B", "year": "2022", "url": "https://doi.org/10.1007/s00340-022-07836-5", "author": [ "Ayoub Boubekraoui","Frieder Beirow","Thomas Graf","Marwan Abdou Ahmed" ], "authors": [ {"first" : "Ayoub", "last" : "Boubekraoui"}, {"first" : "Frieder", "last" : "Beirow"}, {"first" : "Thomas", "last" : "Graf"}, {"first" : "Marwan", "last" : "Abdou Ahmed"} ], "volume": "128","number": "7","pages": "120--","abstract": "We report on the first demonstration of an intra-cavity spectral beam combining of two fundamental-mode laser beams generated by a dual Yb:YAG thin-disk resonator. The two thin-disk lasers (TDLs) were operated at the two slightly different wavelengths of 1028 nm and 1032 nm. A resonant diffraction grating waveguide structure was used as common spectral stabilizer and combiner. An average power exceeding 200 W with close to diffraction-limited beam quality ( $$M^2<1.3$$) was obtained with the presented approach.", "issn" : "14320649", "refid" : "Boubekraoui2022", "doi" : "10.1007/s00340-022-07836-5", "bibtexKey": "boubekraoui2022intracavity" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/21105676d6caa214a31e39d6d56969daa/a.boubekraoui", "tags" : [ "Thin-disk","diffraction","grating","laser","myown","peer" ], "intraHash" : "1105676d6caa214a31e39d6d56969daa", "interHash" : "83e4235580a2d04c84dace8c96f28f1f", "label" : "Intra-cavity wavelength multiplexing of high-brightness thin-disk laser beams", "user" : "a.boubekraoui", "description" : "", "date" : "2022-07-11 18:03:57", "changeDate" : "2022-07-12 08:26:37", "count" : 2, "pub-type": "article", "journal": "Applied Physics B", "year": "2022", "url": "https://doi.org/10.1007/s00340-022-07836-5", "author": [ "Ayoub Boubekraoui","Frieder Beirow","Thomas Graf","Marwan Abdou Ahmed" ], "authors": [ {"first" : "Ayoub", "last" : "Boubekraoui"}, {"first" : "Frieder", "last" : "Beirow"}, {"first" : "Thomas", "last" : "Graf"}, {"first" : "Marwan", "last" : "Abdou Ahmed"} ], "volume": "128","number": "7","pages": "120--","abstract": "We report on the first demonstration of an intra-cavity spectral beam combining of two fundamental-mode laser beams generated by a dual Yb:YAG thin-disk resonator. The two thin-disk lasers (TDLs) were operated at the two slightly different wavelengths of 1028 nm and 1032 nm. A resonant diffraction grating waveguide structure was used as common spectral stabilizer and combiner. An average power exceeding 200 W with close to diffraction-limited beam quality ( $$M^2<1.3$$) was obtained with the presented approach.", "issn" : "14320649", "refid" : "Boubekraoui2022", "doi" : "10.1007/s00340-022-07836-5", "bibtexKey": "boubekraoui2022intracavity" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/20cc8f23fd2d3a08d413b7cbb9a413a3f/huebleriac", "tags" : [ "ESR","anion","cyclic","diffraction","formation","gallium","indium;electron","mol","monomeric","radical","silylmethyl","silylmethylgallium;silylmethyl","structure","voltammetry" ], "intraHash" : "0cc8f23fd2d3a08d413b7cbb9a413a3f", "interHash" : "392626e30029f00db3365a7c3a5ed3c3", "label" : "Gas-Phase Structure of the Monomeric Alkylgallium(I) Compound Ga[C(SiMe3)3] and the Electrochemical Behavior of Ga4[C(SiMe3)3]4 and In4[C(SiMe3)3]4 with EPR Evidence for a Ga4R4 Radical Anion", "user" : "huebleriac", "description" : "", "date" : "2022-06-15 11:26:56", "changeDate" : "2022-06-15 09:26:56", "count" : 3, "pub-type": "article", "journal": "Organometallics", "year": "1996", "url": "", "author": [ "Arne Haaland","Kjell-Gunnar Martinsen","H. V. Volden","Wolfgang Kaim","Eberhard Waldhoer","Werner Uhl","Uwe. Schuetz" ], "authors": [ {"first" : "Arne", "last" : "Haaland"}, {"first" : "Kjell-Gunnar", "last" : "Martinsen"}, {"first" : "H. V.", "last" : "Volden"}, {"first" : "Wolfgang", "last" : "Kaim"}, {"first" : "Eberhard", "last" : "Waldhoer"}, {"first" : "Werner", "last" : "Uhl"}, {"first" : "Uwe.", "last" : "Schuetz"} ], "volume": "15","number": "4","pages": "1146--1150","abstract": "The gallium(I) compd. Ga4[C(SiMe3)3]4 (1) with a tetrahedral Ga4 core in the solid state gives on evapn. the monomeric Ga(I) alkyl Ga[C(SiMe3)3] with the unique structural situation of a Ga atom solely coordinated by one singly bonded carbon ligand. Its mol. structure was detd. now by gas-phase electron diffraction yielding a Ga-C bond length of 206.4(17) pm, similar to that found in the solid state for the tetramer and much longer than in compds. with gallium in the normal oxidn. state of +3. As shown by cyclic voltammetry, 1 and the analogous cluster In4[C(SiMe3)3]4 (2) could both be reversibly reduced at about -2 V vs Fc+/0. Whereas the reduced organoindium tetramer did not exhibit any detectable EPR signals between 4 and 300 K, the gallium analog showed an EPR spectrum compatible with the formulation [(RGa0.75)4].bul.-; i.e. the unpaired electron was delocalized over all four metal centers (a(69Ga) = 1.93 mT, a(71Ga) = 2.45 mT, 4 Ga). [on SciFinder(R)]", "issn" : "0276-7333", "doi" : "10.1021/OM950755S", "bibtexKey": "Haaland.1996" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/28369a5b0b9c1d5b9bd78f25cc22c6d13/florianbienert", "tags" : [ "LIL","algorithm","chirp","diffraction","diffraction_grating","grating","interference","interference_lithography","myown","peer","therory" ], "intraHash" : "8369a5b0b9c1d5b9bd78f25cc22c6d13", "interHash" : "503e2f12069fc6f23a499ccd4bb69f64", "label" : "Theoretical investigation on the elimination of the period chirp by deliberate substrate deformations", "user" : "florianbienert", "description" : "", "date" : "2022-06-09 10:04:50", "changeDate" : "2022-06-09 08:04:50", "count" : 3, "pub-type": "article", "journal": "Optics Express","publisher":"Optica Publishing Group", "year": "2022", "url": "https://doi.org/10.1364%2Foe.458636", "author": [ "Florian Bienert","Thomas Graf","Marwan Abdou Ahmed" ], "authors": [ {"first" : "Florian", "last" : "Bienert"}, {"first" : "Thomas", "last" : "Graf"}, {"first" : "Marwan", "last" : "Abdou Ahmed"} ], "volume": "30","number": "13","pages": "22410","abstract": "We present a theoretical investigation on the approach of deliberately bending the substrate during the exposure within laser interference lithography to compensate for the period chirp. It is shown that the yet undiscovered function of the surface geometry, necessary to achieve the zero-chirp case (i.e. having a perfectly constant period over the whole substrate) is determined by a first-order differential equation. As the direct analytical solution of this differential equation is difficult, a numerical approach is developed, based on the optimization of pre-defined functions towards the unknown analytical solution of the differential equation by means of a Nelder-Mead simplex algorithm. By applying this method to a concrete example, we show that an off-center placement of the substrate with respect to the point sources is advantageous both in terms of achievable period and substrate curvature and that a fourth-order polynomial can greatly satisfy the differential equation leading to a root-mean-square deviation of only 1.4 pm with respect to the targeted period of 610\u2005nm.", "doi" : "10.1364/oe.458636", "bibtexKey": "Bienert_2022" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/28369a5b0b9c1d5b9bd78f25cc22c6d13/ifsw", "tags" : [ "myown","chirp","diffraction","diffraction_grating","interference_lithography","LIL","from:florianbienert","grating","peer","interference","therory","algorithm" ], "intraHash" : "8369a5b0b9c1d5b9bd78f25cc22c6d13", "interHash" : "503e2f12069fc6f23a499ccd4bb69f64", "label" : "Theoretical investigation on the elimination of the period chirp by deliberate substrate deformations", "user" : "ifsw", "description" : "", "date" : "2022-06-09 10:04:50", "changeDate" : "2022-06-09 08:04:50", "count" : 3, "pub-type": "article", "journal": "Optics Express","publisher":"Optica Publishing Group", "year": "2022", "url": "https://doi.org/10.1364%2Foe.458636", "author": [ "Florian Bienert","Thomas Graf","Marwan Abdou Ahmed" ], "authors": [ {"first" : "Florian", "last" : "Bienert"}, {"first" : "Thomas", "last" : "Graf"}, {"first" : "Marwan", "last" : "Abdou Ahmed"} ], "volume": "30","number": "13","pages": "22410","abstract": "We present a theoretical investigation on the approach of deliberately bending the substrate during the exposure within laser interference lithography to compensate for the period chirp. It is shown that the yet undiscovered function of the surface geometry, necessary to achieve the zero-chirp case (i.e. having a perfectly constant period over the whole substrate) is determined by a first-order differential equation. As the direct analytical solution of this differential equation is difficult, a numerical approach is developed, based on the optimization of pre-defined functions towards the unknown analytical solution of the differential equation by means of a Nelder-Mead simplex algorithm. By applying this method to a concrete example, we show that an off-center placement of the substrate with respect to the point sources is advantageous both in terms of achievable period and substrate curvature and that a fourth-order polynomial can greatly satisfy the differential equation leading to a root-mean-square deviation of only 1.4 pm with respect to the targeted period of 610\u2005nm.", "doi" : "10.1364/oe.458636", "bibtexKey": "Bienert_2022" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/2c92c0beab91cf22a13ce0cb2209438b6/ifsw", "tags" : [ "chirp","period","Interference","diffraction_grating","Laser_beam","ltihography","interference_lithography","from:florianbienert","ifsw","Diffraction","grating" ], "intraHash" : "c92c0beab91cf22a13ce0cb2209438b6", "interHash" : "1ecc9d05102c7ed5274b48e382dbbf69", "label" : "Comprehensive theoretical analysis of the period chirp in laser interference lithography", "user" : "ifsw", "description" : "", "date" : "2022-03-17 14:03:13", "changeDate" : "2022-03-17 13:03:13", "count" : 2, "pub-type": "article", "journal": "Appl. Opt.","publisher":"OSA", "year": "2022", "url": "http://opg.optica.org/ao/abstract.cfm?URI=ao-61-9-2313", "author": [ "Florian Bienert","Thomas Graf","Marwan Abdou Ahmed" ], "authors": [ {"first" : "Florian", "last" : "Bienert"}, {"first" : "Thomas", "last" : "Graf"}, {"first" : "Marwan", "last" : "Abdou Ahmed"} ], "volume": "61","number": "9","pages": "2313--2326","abstract": "We present a theoretical investigation on laser interference lithography used for the exposure of linear gratings. The focus is on the geometry of the arising interference lines on the substrate, in particular on their period and orientation, depending on the illumination geometry as determined by the setup. The common approach with point sources emitting spherical wavefronts is considered for the illumination. Three different cases are discussed, namely the interference between two point sources with either two convex, two concave or mixed, i.e., convex and concave wavefronts. General equations focusing mainly on the calculation of the period and the orientation of the grating lines are derived for each of the three exposure cases considering arbitrarily positioned point sources and arbitrarily shaped substrates. Additionally, the interference of symmetrically positioned point sources illuminating plane substrates is investigated, as these boundary conditions significantly simplify the derived equations.", "doi" : "10.1364/AO.451873", "bibtexKey": "Bienert:22" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/2c92c0beab91cf22a13ce0cb2209438b6/florianbienert", "tags" : [ "Diffraction","Interference","Laser_beam","chirp","diffraction_grating","grating","ifsw","interference_lithography","ltihography","period" ], "intraHash" : "c92c0beab91cf22a13ce0cb2209438b6", "interHash" : "1ecc9d05102c7ed5274b48e382dbbf69", "label" : "Comprehensive theoretical analysis of the period chirp in laser interference lithography", "user" : "florianbienert", "description" : "", "date" : "2022-03-17 13:51:15", "changeDate" : "2022-03-17 13:03:13", "count" : 2, "pub-type": "article", "journal": "Appl. Opt.","publisher":"OSA", "year": "2022", "url": "http://opg.optica.org/ao/abstract.cfm?URI=ao-61-9-2313", "author": [ "Florian Bienert","Thomas Graf","Marwan Abdou Ahmed" ], "authors": [ {"first" : "Florian", "last" : "Bienert"}, {"first" : "Thomas", "last" : "Graf"}, {"first" : "Marwan", "last" : "Abdou Ahmed"} ], "volume": "61","number": "9","pages": "2313--2326","abstract": "We present a theoretical investigation on laser interference lithography used for the exposure of linear gratings. The focus is on the geometry of the arising interference lines on the substrate, in particular on their period and orientation, depending on the illumination geometry as determined by the setup. The common approach with point sources emitting spherical wavefronts is considered for the illumination. Three different cases are discussed, namely the interference between two point sources with either two convex, two concave or mixed, i.e., convex and concave wavefronts. General equations focusing mainly on the calculation of the period and the orientation of the grating lines are derived for each of the three exposure cases considering arbitrarily positioned point sources and arbitrarily shaped substrates. Additionally, the interference of symmetrically positioned point sources illuminating plane substrates is investigated, as these boundary conditions significantly simplify the derived equations.", "doi" : "10.1364/AO.451873", "bibtexKey": "Bienert:22" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/2dd7f39693347ef7f245a75e36ca30bf3/ifsw", "tags" : [ "Absorption","Capillary","Diffraction","Interference","Laser","RayTracing","from:peterberger","peer" ], "intraHash" : "dd7f39693347ef7f245a75e36ca30bf3", "interHash" : "5a24b4ea225435ba422eab757dcd2b06", "label" : "Comparison between ray-tracing and physical optics for the computation of light absorption in capillaries -- the influence of diffraction and interference", "user" : "ifsw", "description" : "", "date" : "2020-02-25 17:30:48", "changeDate" : "2020-02-25 16:44:32", "count" : 2, "pub-type": "article", "journal": "Opt. Express","publisher":"OSA", "year": "2012", "url": "http://www.opticsexpress.org/abstract.cfm?URI=oe-20-24-26606", "author": [ "Yuan Qin","Andreas Michalowski","Rudolf Weber","Sen Yang","Thomas Graf","Xiaowu Ni" ], "authors": [ {"first" : "Yuan", "last" : "Qin"}, {"first" : "Andreas", "last" : "Michalowski"}, {"first" : "Rudolf", "last" : "Weber"}, {"first" : "Sen", "last" : "Yang"}, {"first" : "Thomas", "last" : "Graf"}, {"first" : "Xiaowu", "last" : "Ni"} ], "volume": "20","number": "24","pages": "26606--26617","abstract": "Ray-tracing is the commonly used technique to calculate the absorption of light in laser deep-penetration welding or drilling. Since new lasers with high brilliance enable small capillaries with high aspect ratios, diffraction might become important. To examine the applicability of the ray-tracing method, we studied the total absorptance and the absorbed intensity of polarized beams in several capillary geometries. The ray-tracing results are compared with more sophisticated simulations based on physical optics. The comparison shows that the simple ray-tracing is applicable to calculate the total absorptance in triangular grooves and in conical capillaries but not in rectangular grooves. To calculate the distribution of the absorbed intensity ray-tracing fails due to the neglected interference, diffraction, and the effects of beam propagation in the capillaries with sub-wavelength diameter. If diffraction is avoided e.g. with beams smaller than the entrance pupil of the capillary or with very shallow capillaries, the distribution of the absorbed intensity calculated by ray-tracing corresponds to the local average of the interference pattern found by physical optics.", "doi" : "10.1364/OE.20.026606", "bibtexKey": "Qin.2012.Comparison" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/2dd7f39693347ef7f245a75e36ca30bf3/peterberger", "tags" : [ "Absorption","Capillary","Diffraction","Interference","Laser","RayTracing" ], "intraHash" : "dd7f39693347ef7f245a75e36ca30bf3", "interHash" : "5a24b4ea225435ba422eab757dcd2b06", "label" : "Comparison between ray-tracing and physical optics for the computation of light absorption in capillaries -- the influence of diffraction and interference", "user" : "peterberger", "description" : "", "date" : "2020-02-25 17:30:48", "changeDate" : "2020-02-25 16:30:48", "count" : 2, "pub-type": "article", "journal": "Opt. Express","publisher":"OSA", "year": "2012", "url": "http://www.opticsexpress.org/abstract.cfm?URI=oe-20-24-26606", "author": [ "Yuan Qin","Andreas Michalowski","Rudolf Weber","Sen Yang","Thomas Graf","Xiaowu Ni" ], "authors": [ {"first" : "Yuan", "last" : "Qin"}, {"first" : "Andreas", "last" : "Michalowski"}, {"first" : "Rudolf", "last" : "Weber"}, {"first" : "Sen", "last" : "Yang"}, {"first" : "Thomas", "last" : "Graf"}, {"first" : "Xiaowu", "last" : "Ni"} ], "volume": "20","number": "24","pages": "26606--26617","abstract": "Ray-tracing is the commonly used technique to calculate the absorption of light in laser deep-penetration welding or drilling. Since new lasers with high brilliance enable small capillaries with high aspect ratios, diffraction might become important. To examine the applicability of the ray-tracing method, we studied the total absorptance and the absorbed intensity of polarized beams in several capillary geometries. The ray-tracing results are compared with more sophisticated simulations based on physical optics. The comparison shows that the simple ray-tracing is applicable to calculate the total absorptance in triangular grooves and in conical capillaries but not in rectangular grooves. To calculate the distribution of the absorbed intensity ray-tracing fails due to the neglected interference, diffraction, and the effects of beam propagation in the capillaries with sub-wavelength diameter. If diffraction is avoided e.g. with beams smaller than the entrance pupil of the capillary or with very shallow capillaries, the distribution of the absorbed intensity calculated by ray-tracing corresponds to the local average of the interference pattern found by physical optics.", "doi" : "10.1364/OE.20.026606", "bibtexKey": "Qin.2012.Comparison" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/20cc8f23fd2d3a08d413b7cbb9a413a3f/b_schwederski", "tags" : [ "ESR","anion","cyclic","diffraction","formation","gallium","indium;electron","mol","monomeric","radical","silylmethyl","silylmethylgallium;silylmethyl","structure","voltammetry" ], "intraHash" : "0cc8f23fd2d3a08d413b7cbb9a413a3f", "interHash" : "392626e30029f00db3365a7c3a5ed3c3", "label" : "Gas-Phase Structure of the Monomeric Alkylgallium(I) Compound Ga[C(SiMe3)3] and the Electrochemical Behavior of Ga4[C(SiMe3)3]4 and In4[C(SiMe3)3]4 with EPR Evidence for a Ga4R4 Radical Anion", "user" : "b_schwederski", "description" : "", "date" : "2019-07-15 13:41:23", "changeDate" : "2019-07-15 11:42:10", "count" : 3, "pub-type": "article", "journal": "Organometallics", "year": "1996", "url": "", "author": [ "Arne Haaland","Kjell-Gunnar Martinsen","H. V. Volden","Wolfgang Kaim","Eberhard Waldhoer","Werner Uhl","Uwe. Schuetz" ], "authors": [ {"first" : "Arne", "last" : "Haaland"}, {"first" : "Kjell-Gunnar", "last" : "Martinsen"}, {"first" : "H. V.", "last" : "Volden"}, {"first" : "Wolfgang", "last" : "Kaim"}, {"first" : "Eberhard", "last" : "Waldhoer"}, {"first" : "Werner", "last" : "Uhl"}, {"first" : "Uwe.", "last" : "Schuetz"} ], "volume": "15","number": "4","pages": "1146--1150","abstract": "The gallium(I) compd. Ga4[C(SiMe3)3]4 (1) with a tetrahedral Ga4 core in the solid state gives on evapn. the monomeric Ga(I) alkyl Ga[C(SiMe3)3] with the unique structural situation of a Ga atom solely coordinated by one singly bonded carbon ligand. Its mol. structure was detd. now by gas-phase electron diffraction yielding a Ga-C bond length of 206.4(17) pm, similar to that found in the solid state for the tetramer and much longer than in compds. with gallium in the normal oxidn. state of +3. As shown by cyclic voltammetry, 1 and the analogous cluster In4[C(SiMe3)3]4 (2) could both be reversibly reduced at about -2 V vs Fc+/0. Whereas the reduced organoindium tetramer did not exhibit any detectable EPR signals between 4 and 300 K, the gallium analog showed an EPR spectrum compatible with the formulation [(RGa0.75)4].bul.-; i.e. the unpaired electron was delocalized over all four metal centers (a(69Ga) = 1.93 mT, a(71Ga) = 2.45 mT, 4 Ga). [on SciFinder(R)]", "issn" : "0276-7333", "doi" : "10.1021/OM950755S", "bibtexKey": "Haaland.1996" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/29a1bef5aff0a2fc5f5751d89e09d246b/florianfetzer", "tags" : [ "AbdouAhmed,Marwan","Diffraction","Laser","OpticalElements","Studienarbeit" ], "intraHash" : "9a1bef5aff0a2fc5f5751d89e09d246b", "interHash" : "4a6e7bb30d7290129b314078327875ec", "label" : "Charakterisierung und Funktionstest eines neuen Strahlteilungskonzptes auf Basis von Beugungsgittern für den Einsatz in der Photovoltaikindustrie", "user" : "florianfetzer", "description" : "", "date" : "2019-04-09 09:46:57", "changeDate" : "2019-04-09 07:46:57", "count" : 2, "pub-type": "mastersthesis", "year": "2009", "url": "", "author": [ "N. Strachwitz" ], "authors": [ {"first" : "N.", "last" : "Strachwitz"} ], "number": "IFSW09-11", "bibtexKey": "Strachwitz.2009.Charakterisierung" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/29a1bef5aff0a2fc5f5751d89e09d246b/ifsw", "tags" : [ "Studienarbeit","Diffraction","Laser","OpticalElements","from:florianfetzer","AbdouAhmed,Marwan" ], "intraHash" : "9a1bef5aff0a2fc5f5751d89e09d246b", "interHash" : "4a6e7bb30d7290129b314078327875ec", "label" : "Charakterisierung und Funktionstest eines neuen Strahlteilungskonzptes auf Basis von Beugungsgittern für den Einsatz in der Photovoltaikindustrie", "user" : "ifsw", "description" : "", "date" : "2019-04-09 09:46:57", "changeDate" : "2019-04-09 07:46:57", "count" : 2, "pub-type": "mastersthesis", "year": "2009", "url": "", "author": [ "N. Strachwitz" ], "authors": [ {"first" : "N.", "last" : "Strachwitz"} ], "number": "IFSW09-11", "bibtexKey": "Strachwitz.2009.Charakterisierung" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/2429f7939b9fb9d65d413c25849ec0da0/chrisvwr", "tags" : [ "Diffraction","FTIR","mapping" ], "intraHash" : "429f7939b9fb9d65d413c25849ec0da0", "interHash" : "cc35a9fca430ebfabfd1f0eb5f509289", "label" : "Nearly diffraction limited FTIR mapping using an ultrastable broadband femtosecond laser tunable from 1.33 to 8 µm", "user" : "chrisvwr", "description" : "", "date" : "2019-02-25 13:24:24", "changeDate" : "2019-02-25 12:24:24", "count" : 2, "pub-type": "article", "journal": "Opt. Express", "year": "2017", "url": "", "author": [ "F. Mörz","R. Semenyshyn","T. Steinle","F. Neubrech","U. Zschieschang","A. Steinmann","H. Giessen" ], "authors": [ {"first" : "F.", "last" : "Mörz"}, {"first" : "R.", "last" : "Semenyshyn"}, {"first" : "T.", "last" : "Steinle"}, {"first" : "F.", "last" : "Neubrech"}, {"first" : "U.", "last" : "Zschieschang"}, {"first" : "A.", "last" : "Steinmann"}, {"first" : "H.", "last" : "Giessen"} ], "volume": "25","number": "26","pages": "32355", "doi" : "doi.org/10.1364/OE.25.032355", "bibtexKey": "morz2017nearly" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/215b3549913719cd36a202666f417930b/chrisvwr", "tags" : [ "FTIR","diffraction","mapping" ], "intraHash" : "15b3549913719cd36a202666f417930b", "interHash" : "01647ebd49f919a3474bf9e6b541113a", "label" : "Unbiased all-optical random-number generator", "user" : "chrisvwr", "description" : "", "date" : "2019-02-25 13:21:49", "changeDate" : "2019-02-25 12:21:49", "count" : 5, "pub-type": "article", "journal": "Phys. Rev.", "year": "2017", "url": "", "author": [ "T. Steinle","J. N. Greiner","J. Wrachtrup","H. Giessen","I. Gerhardt" ], "authors": [ {"first" : "T.", "last" : "Steinle"}, {"first" : "J. N.", "last" : "Greiner"}, {"first" : "J.", "last" : "Wrachtrup"}, {"first" : "H.", "last" : "Giessen"}, {"first" : "I.", "last" : "Gerhardt"} ], "volume": "X","number": "7","pages": "041050", "doi" : "doi.org/10.1103/PhysRevX.7.041050", "bibtexKey": "steinle2017nearly" } , { "type" : "Publication", "id" : "https://puma.ub.uni-stuttgart.de/bibtex/29b844a15ed521aa2c61f63c83454512e/ihf", "tags" : [ "Diffraction","scattering","Electromagnetic","Closed-form","impedance","Surface","from:yvesm","Impedance","solutionssend:unibiblio" ], "intraHash" : "9b844a15ed521aa2c61f63c83454512e", "interHash" : "2563992ed61e9f397c7ac6c2b80230bb", "label" : "Diffraction of a plane electromagnetic wave by a uniformly moving, anisotropic impedance wedge", "user" : "ihf", "description" : "", "date" : "2019-02-08 17:37:34", "changeDate" : "2019-02-08 16:37:34", "count" : 1, "pub-type": "conference", "booktitle": "2017 XXXIInd General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS)", "year": "2017", "url": "https://ieeexplore.ieee.org/document/8105359", "author": [ "Ning Yan Zhu","Mikhail A. Lyalinov" ], "authors": [ {"first" : "Ning Yan", "last" : "Zhu"}, {"first" : "Mikhail A.", "last" : "Lyalinov"} ], "abstract": "This paper studies diffraction of a plane electromagnetic wave by a uniformly moving, anisotropic impedance wedge and presents an exact solution in closed form to a class of impedance wedges based on frame hopping [1] and earlier results for diffraction by such obstacles at rest [2, 3].", "isbn" : "978-90-825987-0-4", "doi" : "10.23919/URSIGASS.2017.8105359", "bibtexKey": "zhu2017diffraction" } ] }