PUMA publications for /tag/walterhttps://puma.ub.uni-stuttgart.de/tag/walterPUMA RSS feed for /tag/walter2024-03-28T12:44:03+01:00A 10 V Transfer Standard Based on Low-Noise Solid-State Zener Voltage Reference ADR1000https://puma.ub.uni-stuttgart.de/bibtex/2d81c96ff3f3f0501e0a51b36117a4f54/ifmifm2024-03-07T21:00:08+01:00ifm_article walter zimmermann <span data-person-type="author" class="authorEditorList "><span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="André Bülau" itemprop="url" href="/person/11e89be94586cbab56f32733c655ea134/author/0"><span itemprop="name">A. Bülau</span></a></span>, </span><span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="Daniela Walter" itemprop="url" href="/person/11e89be94586cbab56f32733c655ea134/author/1"><span itemprop="name">D. Walter</span></a></span>, </span> and <span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="André Zimmermann" itemprop="url" href="/person/11e89be94586cbab56f32733c655ea134/author/2"><span itemprop="name">A. Zimmermann</span></a></span></span>. </span><span class="additional-entrytype-information"><span itemtype="http://schema.org/PublicationIssue" itemscope="itemscope" itemprop="isPartOf"><em><span itemprop="journal">Metrology</span>, </em> <em><span itemtype="http://schema.org/PublicationVolume" itemscope="itemscope" itemprop="isPartOf"><span itemprop="volumeNumber">4 </span></span>(<span itemprop="issueNumber">1</span>):
<span itemprop="pagination">98-116</span></em> </span>(<em><span>March 2024<meta content="March 2024" itemprop="datePublished"/></span></em>)</span>Thu Mar 07 21:00:08 CET 2024Metrology03198-116A 10 V Transfer Standard Based on Low-Noise Solid-State Zener Voltage Reference ADR100042024ifm_article walter zimmermann Voltage standards are widely used to transfer volts from Josephson voltage standards (JVSs) at national metrology institutes (NMIs) into calibration labs to maintain the volts and to transfer them to test equipment at production lines. Therefore, commercial voltage standards based on Zener diodes are used. Analog Devices Inc. (San Jose, CA, USA), namely, Eric Modica, introduced the ADR1000KHZ, a successor to the legendary LTZ1000, at the Metrology Meeting 2021. The first production samples were already available prior to this event. In this article, this new temperature-stabilized Zener diode is compared to several others as per datasheet specifications. Motivated by the superior parameters, a 10 V transfer standard prototype for laboratory use with commercial off-the-shelf components such as resistor networks and chopper amplifiers was built. How much effort it takes to reach the given parameters was investigated. This paper describes how the reference was set up to operate it at its zero-temperature coefficient (z.t.c.) temperature and to lower the requirements for the oven stability. Furthermore, it is shown how the overall temperature coefficient (t.c.) of the circuit was reduced. For the buffered Zener voltage, a t.c. of almost zero, and with amplification to 10 V, a t.c. of <0.01 µV/V/K was achieved in a temperature span of 15 to 31 °C. For the buffered Zener voltage, a noise of ~584 nVp-p and for the 10 V output, ~805 nVp-p were obtained. Finally, 850 days of drift data were taken by comparing the transfer standard prototype to two Fluke 7000 voltage standards according to the method described in NBS Technical Note 430. The drift specification was, however, not met.A 10 V Transfer Standard Based on Low-Noise Solid-State Zener Voltage Reference ADR1000https://puma.ub.uni-stuttgart.de/bibtex/2d81c96ff3f3f0501e0a51b36117a4f54/holgerruehlholgerruehl2024-03-07T21:00:08+01:00ifm_article walter zimmermann <span data-person-type="author" class="authorEditorList "><span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="André Bülau" itemprop="url" href="/person/11e89be94586cbab56f32733c655ea134/author/0"><span itemprop="name">A. Bülau</span></a></span>, </span><span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="Daniela Walter" itemprop="url" href="/person/11e89be94586cbab56f32733c655ea134/author/1"><span itemprop="name">D. Walter</span></a></span>, </span> and <span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="André Zimmermann" itemprop="url" href="/person/11e89be94586cbab56f32733c655ea134/author/2"><span itemprop="name">A. Zimmermann</span></a></span></span>. </span><span class="additional-entrytype-information"><span itemtype="http://schema.org/PublicationIssue" itemscope="itemscope" itemprop="isPartOf"><em><span itemprop="journal">Metrology</span>, </em> <em><span itemtype="http://schema.org/PublicationVolume" itemscope="itemscope" itemprop="isPartOf"><span itemprop="volumeNumber">4 </span></span>(<span itemprop="issueNumber">1</span>):
<span itemprop="pagination">98-116</span></em> </span>(<em><span>2024<meta content="2024" itemprop="datePublished"/></span></em>)</span>Thu Mar 07 21:00:08 CET 2024Metrology198-116A 10 V Transfer Standard Based on Low-Noise Solid-State Zener Voltage Reference ADR100042024ifm_article walter zimmermann Voltage standards are widely used to transfer volts from Josephson voltage standards (JVSs) at national metrology institutes (NMIs) into calibration labs to maintain the volts and to transfer them to test equipment at production lines. Therefore, commercial voltage standards based on Zener diodes are used. Analog Devices Inc. (San Jose, CA, USA), namely, Eric Modica, introduced the ADR1000KHZ, a successor to the legendary LTZ1000, at the Metrology Meeting 2021. The first production samples were already available prior to this event. In this article, this new temperature-stabilized Zener diode is compared to several others as per datasheet specifications. Motivated by the superior parameters, a 10 V transfer standard prototype for laboratory use with commercial off-the-shelf components such as resistor networks and chopper amplifiers was built. How much effort it takes to reach the given parameters was investigated. This paper describes how the reference was set up to operate it at its zero-temperature coefficient (z.t.c.) temperature and to lower the requirements for the oven stability. Furthermore, it is shown how the overall temperature coefficient (t.c.) of the circuit was reduced. For the buffered Zener voltage, a t.c. of almost zero, and with amplification to 10 V, a t.c. of <0.01 µV/V/K was achieved in a temperature span of 15 to 31 °C. For the buffered Zener voltage, a noise of ~584 nVp-p and for the 10 V output, ~805 nVp-p were obtained. Finally, 850 days of drift data were taken by comparing the transfer standard prototype to two Fluke 7000 voltage standards according to the method described in NBS Technical Note 430. The drift specification was, however, not met.Inkjet-Printed Temperature Sensors Characterized according to Standardshttps://puma.ub.uni-stuttgart.de/bibtex/2c7ee0b7110c96281135dea2c977d6641/samethalvacisamethalvaci2023-06-16T08:49:47+02:00buelau glaeser ifm_article jaeger schwenck walter zimmermann <span data-person-type="author" class="authorEditorList "><span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="Jonas Jäger" itemprop="url" href="/person/128cbb1455ccc41bc71afa015fdbe40df/author/0"><span itemprop="name">J. Jäger</span></a></span>, </span><span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="Adrian Schwenck" itemprop="url" href="/person/128cbb1455ccc41bc71afa015fdbe40df/author/1"><span itemprop="name">A. Schwenck</span></a></span>, </span><span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="Daniela Walter" itemprop="url" href="/person/128cbb1455ccc41bc71afa015fdbe40df/author/2"><span itemprop="name">D. Walter</span></a></span>, </span><span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="André Bülau" itemprop="url" href="/person/128cbb1455ccc41bc71afa015fdbe40df/author/3"><span itemprop="name">A. Bülau</span></a></span>, </span><span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="Kerstin Gläser" itemprop="url" href="/person/128cbb1455ccc41bc71afa015fdbe40df/author/4"><span itemprop="name">K. Gläser</span></a></span>, </span> and <span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="André Zimmermann" itemprop="url" href="/person/128cbb1455ccc41bc71afa015fdbe40df/author/5"><span itemprop="name">A. Zimmermann</span></a></span></span>. </span><span class="additional-entrytype-information"><span itemtype="http://schema.org/PublicationIssue" itemscope="itemscope" itemprop="isPartOf"><em><span itemprop="journal">Sensors</span>, </em> </span>(<em><span>2022<meta content="2022" itemprop="datePublished"/></span></em>)</span>Fri Jun 16 08:49:47 CEST 2023Sensors21Inkjet-Printed Temperature Sensors Characterized according to Standards222022buelau glaeser ifm_article jaeger schwenck walter zimmermann This paper describes the characterization of inkjet-printed resistive temperature sensors according to the international standard IEC 61928-2. The goal is to evaluate such sensors comprehensively, to identify important manufacturing processes, and to generate data for inkjet-printed temperature sensors according to the mentioned standard for the first time, which will enable future comparisons across different publications. Temperature sensors were printed with a silver nanoparticle ink on injection-molded parts. After printing, the sensors were sintered with different parameters to investigate their influences on the performance. Temperature sensors were characterized in a temperature range from 10 °C to 85 °C at 60% RH. It turned out that the highest tested sintering temperature of 200 °C, the longest dwell time of 24 h, and a coating with fluoropolymer resulted in the best sensor properties, which are a high temperature coefficient of resistance, low hysteresis, low non-repeatability, and low maximum error. The determined hysteresis, non-repeatability, and maximum error are below 1.4% of the full-scale output (FSO), and the temperature coefficient of resistance is 1.23–1.31 × 10−3 K−1. These results show that inkjet printing is a capable technology for the manufacturing of temperature sensors for applications up to 85 °C, such as lab-on-a-chip devices.Review on Excess Noise Measurements of Resistorshttps://puma.ub.uni-stuttgart.de/bibtex/2d427329554567cfef18d333b14ad7de9/ifmifm2023-01-31T13:53:35+01:00buelau ifm ifm_article walter zimmermann <span data-person-type="author" class="authorEditorList "><span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="Daniela Walter" itemprop="url" href="/person/177783156d828c4c3864b2dc48e163f16/author/0"><span itemprop="name">D. Walter</span></a></span>, </span><span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="André Bülau" itemprop="url" href="/person/177783156d828c4c3864b2dc48e163f16/author/1"><span itemprop="name">A. Bülau</span></a></span>, </span> and <span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="André Zimmermann" itemprop="url" href="/person/177783156d828c4c3864b2dc48e163f16/author/2"><span itemprop="name">A. Zimmermann</span></a></span></span>. </span><span class="additional-entrytype-information"><span itemtype="http://schema.org/PublicationIssue" itemscope="itemscope" itemprop="isPartOf"><em><span itemprop="journal">Sensors</span>, </em> <em><span itemtype="http://schema.org/PublicationVolume" itemscope="itemscope" itemprop="isPartOf"><span itemprop="volumeNumber">23 </span></span>(<span itemprop="issueNumber">3</span>):
<span itemprop="pagination">1107</span></em> </span>(<em><span>Jan 18, 2023<meta content="Jan 18, 2023" itemprop="datePublished"/></span></em>)</span>Tue Jan 31 13:53:35 CET 2023Sensors0131107Review on Excess Noise Measurements of Resistors232023buelau ifm ifm_article walter zimmermann 18Increasing demands for precision electronics require individual components such as resistors to be specified, as they can be the limiting factor within a circuit. To specify quality and long-term stability of resistors, noise measurements are a common method. This review briefly explains the theoretical background, introduces the noise index and provides an insight on how this index can be compared to other existing parameters. It then focuses on the different methods to measure excess noise in resistors. The respective advantages and disadvantages are pointed out in order to simplify the decision of which setup is suitable for a particular application. Each method is analyzed based on the integration of the device under test, components used, shielding considerations and signal processing. Furthermore, our results on the excess noise of resistors and resistor networks are presented using two different setups, one for very low noise measurements down to 20 µHz and one for broadband up to 100 kHz. The obtained data from these measurements are then compared to published data. Finally, first measurements on commercial strain gauges and inkjet-printed strain gauges are presented that show an additional 1/fα component compared to commercial resistors and resistor networks.Inkjet-Printed Temperature Sensors Characterized according to Standardshttps://puma.ub.uni-stuttgart.de/bibtex/2c7ee0b7110c96281135dea2c977d6641/ifmifm2023-01-31T13:52:14+01:00buelau from:danielawalter from:sameth glaeser ifm_article jaeger jaegeralvaci schwenck walter zimmermann <span data-person-type="author" class="authorEditorList "><span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="Jonas Jäger" itemprop="url" href="/person/128cbb1455ccc41bc71afa015fdbe40df/author/0"><span itemprop="name">J. Jäger</span></a></span>, </span><span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="Adrian Schwenck" itemprop="url" href="/person/128cbb1455ccc41bc71afa015fdbe40df/author/1"><span itemprop="name">A. Schwenck</span></a></span>, </span><span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="Daniela Walter" itemprop="url" href="/person/128cbb1455ccc41bc71afa015fdbe40df/author/2"><span itemprop="name">D. Walter</span></a></span>, </span><span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="André Bülau" itemprop="url" href="/person/128cbb1455ccc41bc71afa015fdbe40df/author/3"><span itemprop="name">A. Bülau</span></a></span>, </span><span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="Kerstin Gläser" itemprop="url" href="/person/128cbb1455ccc41bc71afa015fdbe40df/author/4"><span itemprop="name">K. Gläser</span></a></span>, </span> and <span><span itemtype="http://schema.org/Person" itemscope="itemscope" itemprop="author"><a title="André Zimmermann" itemprop="url" href="/person/128cbb1455ccc41bc71afa015fdbe40df/author/5"><span itemprop="name">A. Zimmermann</span></a></span></span>. </span><span class="additional-entrytype-information"><span itemtype="http://schema.org/PublicationIssue" itemscope="itemscope" itemprop="isPartOf"><em><span itemprop="journal">Sensors</span>, </em> <em><span itemtype="http://schema.org/PublicationVolume" itemscope="itemscope" itemprop="isPartOf"><span itemprop="volumeNumber">22 </span></span>(<span itemprop="issueNumber">21</span>):
<span itemprop="pagination">8145</span></em> </span>(<em><span>October 2022<meta content="October 2022" itemprop="datePublished"/></span></em>)</span>Tue Jan 31 13:52:14 CET 2023Sensors10218145Inkjet-Printed Temperature Sensors Characterized according to Standards222022buelau from:danielawalter from:sameth glaeser ifm_article jaeger jaegeralvaci schwenck walter zimmermann This paper describes the characterization of inkjet-printed resistive temperature sensors according to the international standard IEC 61928-2. The goal is to evaluate such sensors comprehensively, to identify important manufacturing processes, and to generate data for inkjet-printed temperature sensors according to the mentioned standard for the first time, which will enable future comparisons across different publications. Temperature sensors were printed with a silver nanoparticle ink on injection-molded parts. After printing, the sensors were sintered with different parameters to investigate their influences on the performance. Temperature sensors were characterized in a temperature range from 10 °C to 85 °C at 60% RH. It turned out that the highest tested sintering temperature of 200 °C, the longest dwell time of 24 h, and a coating with fluoropolymer resulted in the best sensor properties, which are a high temperature coefficient of resistance, low hysteresis, low non-repeatability, and low maximum error. The determined hysteresis, non-repeatability, and maximum error are below 1.4% of the full-scale output (FSO), and the temperature coefficient of resistance is 1.23–1.31 × 10−3 K−1. These results show that inkjet printing is a capable technology for the manufacturing of temperature sensors for applications up to 85 °C, such as lab-on-a-chip devices.