%0 Conference Paper %1 moseev2020collective %A Moseev, D. %A Laqua, H. P. %A Stange, T. %A Abramovic, I. %A Nielsen, S. K. %A Äkäslompolo, S. %A Avramidis, K. %A Braune, H. %A Gantenbein, G. %A Illy, S. %A Jelonnek, J. %A Jin, J. %A Kasparek, Walter %A Krier, L. %A Korsholm, S. B. %A Lechte, Carsten %A Marek, A. %A Marsen, S. %A Nishiura, M. %A Pagonakis, I. %A Salewski, M. %A Rasmussen, J. %A Tancetti, A. %A Thumm, M. %A Wolf, R. C. %A Team, W7-X %B Journal of Instrumentation %C London %D 2020 %I IOP Publishing %K %N 15, 5 %P C05035 %R 10.1088/1748-0221/15/05/C05035 %T Collective Thomson Scattering Diagnostic for Wendelstein 7-X at 175 GHz

@inproceedings{moseev2020collective, added-at = {2023-08-31T16:15:09.000+0200}, address = {London}, affiliation = {Moseev, D (Reprint Author), Max Planck Inst Plasma Phys, Greifswald, Germany. Moseev, D.; Laqua, H. P.; Stange, T.; Abramovic, I.; Akaslompolo, S.; Braune, H.; Marsen, S.; Wolf, R. C., Max Planck Inst Plasma Phys, Greifswald, Germany. Abramovic, I., Tech Univ Eindhoven, Eindhoven, Netherlands. Nielsen, S. K.; Korsholm, S. B.; Salewski, M.; Rasmussen, J.; Tancetti, A., Tech Univ Denmark, Lyngby, Denmark. Avramidis, K.; Gantenbein, G.; Illy, S.; Jelonnek, J.; Jin, J.; Krier, L.; Marek, A.; Pagonakis, I.; Thumm, M., Karlsruhe Inst Technol, Karlsruhe, Germany. Kasparek, W.; Lechte, C., Univ Stuttgart, Inst Interfacial Proc Engn & Plasma Technol, Stuttgart, Germany. Nishiura, M., Natl Inst Fus Sci, Toki, Gifu, Japan.}, author = {Moseev, D. and Laqua, H. P. and Stange, T. and Abramovic, I. and Nielsen, S. K. and Äkäslompolo, S. and Avramidis, K. and Braune, H. and Gantenbein, G. and Illy, S. and Jelonnek, J. and Jin, J. and Kasparek, Walter and Krier, L. and Korsholm, S. B. and Lechte, Carsten and Marek, A. and Marsen, S. and Nishiura, M. and Pagonakis, I. and Salewski, M. and Rasmussen, J. and Tancetti, A. and Thumm, M. and Wolf, R. C. and Team, W7-X}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/27e5f416009c06de18d7169cb77bd553b/puma-wartung}, doi = {10.1088/1748-0221/15/05/C05035}, eventdate = {2019-09-22/2019-09-26}, eventtitle = {19th International Symposium on Laser-Aided Plasma Diagnostics}, interhash = {c5d9bdd11cd5bb493de4ef317cf0a9f6}, intrahash = {7e5f416009c06de18d7169cb77bd553b}, keywords = {}, language = {eng}, number = {15, 5}, orcid-numbers = {Salewski, Mirko/0000-0002-3699-679X Akaslompolo, Simppa/0000-0002-9554-5147}, pages = {C05035}, publisher = {IOP Publishing}, research-areas = {Instruments & Instrumentation}, researcherid-numbers = {Salewski, Mirko/C-7104-2008 Akaslompolo, Simppa/E-7298-2012}, series = {Journal of Instrumentation}, timestamp = {2023-08-31T14:15:09.000+0200}, title = {Collective Thomson Scattering Diagnostic for Wendelstein 7-X at 175 GHz}, unique-id = {ISI:000534740600035}, venue = {Whitefish, Montana, USA.}, year = 2020 }