%0 Journal Article %1 lohr2016quantitative %A Lohr, Matthias %A Schregle, Ralph %A Jetter, Michael %A Waechter, Clemens %A Mueller-Caspary, Knut %A Mehrtens, Thorsten %A Rosenauer, Andreas %A Pietzonka, Ines %A Strassburg, Martin %A Zweck, Josef %D 2016 %I WILEY-V C H VERLAG GMBH %J PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS %K ihfg %N 1 %P 140-144 %R 10.1002/pssb.201552288 %T Quantitative measurements of internal electric fields with differential phase contrast microscopy on InGaN/GaN quantum well structures %V 253

@article{lohr2016quantitative, added-at = {2018-06-21T16:45:53.000+0200}, affiliation = {Lohr, M (Reprint Author), Univ Regensburg, Fak Phys, Univ Str 31, D-93053 Regensburg, Germany. Lohr, Matthias; Schregle, Ralph; Zweck, Josef, Univ Regensburg, Fak Phys, Univ Str 31, D-93053 Regensburg, Germany. Jetter, Michael; Waechter, Clemens, Univ Stuttgart, Inst Halbleiteropt \& Funkt Grenzflachen, Allmandring 3, D-70569 Stuttgart, Germany. Mueller-Caspary, Knut; Mehrtens, Thorsten; Rosenauer, Andreas, Univ Bremen, Inst Festkorperphys, Otto Hahn Allee 1, D-28359 Bremen, Germany. Pietzonka, Ines; Strassburg, Martin, OSRAM Opto Semicond, Leibnizstr 4, D-93055 Regensburg, Germany.}, author = {Lohr, Matthias and Schregle, Ralph and Jetter, Michael and Waechter, Clemens and Mueller-Caspary, Knut and Mehrtens, Thorsten and Rosenauer, Andreas and Pietzonka, Ines and Strassburg, Martin and Zweck, Josef}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/22ff3c5ada067ff73a29fe3837151b58f/thomas_herzog}, doi = {10.1002/pssb.201552288}, eissn = {1521-3951}, interhash = {63be794ba4553f65becba4bd6f08ef76}, intrahash = {2ff3c5ada067ff73a29fe3837151b58f}, issn = {0370-1972}, journal = {PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS}, keywords = {ihfg}, language = {English}, month = jan, number = 1, orcid-numbers = {Rosenauer, Andreas/0000-0003-4742-0451}, pages = {140-144}, publisher = {WILEY-V C H VERLAG GMBH}, research-areas = {Physics}, timestamp = {2018-06-21T14:45:53.000+0200}, title = {Quantitative measurements of internal electric fields with differential phase contrast microscopy on InGaN/GaN quantum well structures}, type = {Article}, unique-id = {ISI:000370026800020}, volume = 253, year = 2016 }