%0 Conference Paper %1 conf/itc/CeleiroDFST96 %A Celeiro, F. %A Dias, L. %A Ferreira, J. %A Santos, Marcelino B. %A Teixeira, João Paulo %B ITC %D 1996 %I IEEE Computer Society %K dblp %P 620-628 %T Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation. %U http://dblp.uni-trier.de/db/conf/itc/itc1996.html#CeleiroDFST96 %@ 0-7803-3541-4

@inproceedings{conf/itc/CeleiroDFST96, added-at = {2015-08-26T00:00:00.000+0200}, author = {Celeiro, F. and Dias, L. and Ferreira, J. and Santos, Marcelino B. and Teixeira, João Paulo}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/29619b1258dacd42434fc556cd6b16b5b/dblp}, booktitle = {ITC}, crossref = {conf/itc/1996}, ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.1996.557119}, interhash = {ca0b7222a6514da4a93cc69a43ad3bfc}, intrahash = {9619b1258dacd42434fc556cd6b16b5b}, isbn = {0-7803-3541-4}, keywords = {dblp}, pages = {620-628}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T15:32:27.000+0100}, title = {Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1996.html#CeleiroDFST96}, year = 1996 }