%0 Journal Article %1 jakob2017selection %A Jakob, Frank %A Kimmelmann, Martin %A Bertsche, Bernd %D 2017 %I IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC %J IEEE TRANSACTIONS ON RELIABILITY %K B_Bertsche F_Jakob M_Kimmelmann Zuverlässigkeitstechnik from:luciasauter from:samuelschwamm from:thomasherzig ima %N 2 %P 298-308 %R 10.1109/TR.2016.2617364 %T Selection of Acceleration Models for Test Planning and Model Usage %V 66

@article{jakob2017selection, added-at = {2021-03-25T17:56:56.000+0100}, affiliation = {Jakob, F (Reprint Author), Univ Stuttgart, Inst Machine Components, D-70569 Stuttgart, Germany. Jakob, Frank; Kimmelmann, Martin; Bertsche, Bernd, Univ Stuttgart, Inst Machine Components, D-70569 Stuttgart, Germany.}, author = {Jakob, Frank and Kimmelmann, Martin and Bertsche, Bernd}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/263d8b00dad2f00bbd2c4bd739ed2898c/ima-publ}, da = {2018-05-28}, doi = {10.1109/TR.2016.2617364}, eissn = {1558-1721}, interhash = {6788efab75357dd99582316548f9f032}, intrahash = {63d8b00dad2f00bbd2c4bd739ed2898c}, issn = {0018-9529}, journal = {IEEE TRANSACTIONS ON RELIABILITY}, keywords = {B_Bertsche F_Jakob M_Kimmelmann Zuverlässigkeitstechnik from:luciasauter from:samuelschwamm from:thomasherzig ima}, language = {English}, month = {6}, note = 285, number = 2, pages = {298-308}, publisher = {IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC}, research-areas = {Computer Science; Engineering}, timestamp = {2021-05-14T11:34:16.000+0200}, title = {Selection of Acceleration Models for Test Planning and Model Usage}, type = {Article}, unique-id = {ISI:000402717100003}, volume = 66, year = 2017 }