%0 Conference Paper %1 conf/irps/VaisMFLARSCTHGD15 %A Vais, Abhitosh %A Martens, Koen %A Franco, Jacopo %A Lin, D. %A Alian, A. %A Roussel, Philippe %A Sioncke, S. %A Collaert, Nadine %A Thean, Aaron %A Heyns, Marc M. %A Groeseneken, Guido %A Meyer, Kristin De %B IRPS %D 2015 %I IEEE %K dblp %P 5 %T The relationship between border traps characterized by AC admittance and BTI in III-V MOS devices. %U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#VaisMFLARSCTHGD15 %@ 978-1-4673-7362-3

@inproceedings{conf/irps/VaisMFLARSCTHGD15, added-at = {2016-05-19T00:00:00.000+0200}, author = {Vais, Abhitosh and Martens, Koen and Franco, Jacopo and Lin, D. and Alian, A. and Roussel, Philippe and Sioncke, S. and Collaert, Nadine and Thean, Aaron and Heyns, Marc M. and Groeseneken, Guido and Meyer, Kristin De}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/25045434e2e4c5ba5c295a3a7110e693f/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2015}, ee = {http://dx.doi.org/10.1109/IRPS.2015.7112742}, interhash = {ee65d8975054367fc54ce4357451bf39}, intrahash = {5045434e2e4c5ba5c295a3a7110e693f}, isbn = {978-1-4673-7362-3}, keywords = {dblp}, pages = 5, publisher = {IEEE}, timestamp = {2016-05-20T09:35:19.000+0200}, title = {The relationship between border traps characterized by AC admittance and BTI in III-V MOS devices.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#VaisMFLARSCTHGD15}, year = 2015 }