Soft X-ray emission is a known occurrence observed while using ultrafast lasers with high irra-diances for laser material processing. The emitted X-radiation spectrum offers valuable insights into the interaction between the laser beam and the processed material at the zone of interaction, thus serving as a useful diagnostic tool for the laser beam. However, in order to effectively utilize the spectral information, it is crucial to obtain quick measurements of the X-ray emission. Unfortunate-ly, such measurements are often impeded by energy pile-up, which arises due to the short emission times and intense photon fluxes during each laser pulse. To address this challenge, a spectrometer was employed to detect the spectral X-ray emission resulting from laser processing at irradiances of up to 1.6.1014 W/cm². Additionally, a de-piling algorithm was employed to deduce the underlying spectrum free from pile-up effects. These spectra were acquired at different focal positions to ascer-tain the corresponding local irradiance and therefor enable an analysis of the laser beam's focusing properties. By utilizing the spectral X-ray emission, it becomes possible to measure beam character-istics at maximum average power and pulse energy achievable with modern laser systems.
%0 Generic
%1 holland2023determination
%A Holland, Julian
%A Hagenlocher, Christian
%A Weber, Rudolf
%A Graf, Thomas
%D 2023
%K laser mikrobearbeitung myown ukp xRay
%T Fast determination of beam properties of ultrafast lasers during materials processing using spectral X-ray
%X Soft X-ray emission is a known occurrence observed while using ultrafast lasers with high irra-diances for laser material processing. The emitted X-radiation spectrum offers valuable insights into the interaction between the laser beam and the processed material at the zone of interaction, thus serving as a useful diagnostic tool for the laser beam. However, in order to effectively utilize the spectral information, it is crucial to obtain quick measurements of the X-ray emission. Unfortunate-ly, such measurements are often impeded by energy pile-up, which arises due to the short emission times and intense photon fluxes during each laser pulse. To address this challenge, a spectrometer was employed to detect the spectral X-ray emission resulting from laser processing at irradiances of up to 1.6.1014 W/cm². Additionally, a de-piling algorithm was employed to deduce the underlying spectrum free from pile-up effects. These spectra were acquired at different focal positions to ascer-tain the corresponding local irradiance and therefor enable an analysis of the laser beam's focusing properties. By utilizing the spectral X-ray emission, it becomes possible to measure beam character-istics at maximum average power and pulse energy achievable with modern laser systems.
@presentation{holland2023determination,
abstract = {Soft X-ray emission is a known occurrence observed while using ultrafast lasers with high irra-diances for laser material processing. The emitted X-radiation spectrum offers valuable insights into the interaction between the laser beam and the processed material at the zone of interaction, thus serving as a useful diagnostic tool for the laser beam. However, in order to effectively utilize the spectral information, it is crucial to obtain quick measurements of the X-ray emission. Unfortunate-ly, such measurements are often impeded by energy pile-up, which arises due to the short emission times and intense photon fluxes during each laser pulse. To address this challenge, a spectrometer was employed to detect the spectral X-ray emission resulting from laser processing at irradiances of up to 1.6.1014 W/cm². Additionally, a de-piling algorithm was employed to deduce the underlying spectrum free from pile-up effects. These spectra were acquired at different focal positions to ascer-tain the corresponding local irradiance and therefor enable an analysis of the laser beam's focusing properties. By utilizing the spectral X-ray emission, it becomes possible to measure beam character-istics at maximum average power and pulse energy achievable with modern laser systems.},
added-at = {2024-05-08T12:13:21.000+0200},
author = {Holland, Julian and Hagenlocher, Christian and Weber, Rudolf and Graf, Thomas},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2cf429ed85d2719b5a577d5ec739a8bc9/julianholland},
eventdate = {16.06.2023},
interhash = {5298930c14be0113735f22a8ee2294b8},
intrahash = {cf429ed85d2719b5a577d5ec739a8bc9},
keywords = {laser mikrobearbeitung myown ukp xRay},
timestamp = {2024-05-08T12:13:21.000+0200},
title = {Fast determination of beam properties of ultrafast lasers during materials processing using spectral X-ray},
year = 2023
}
